Philip N. H. Nakashima

[1] D. Peng & P.N.H. Nakashima, "Measuring Density Functional Parameters from Electron Diffraction Patterns", Phys. Rev. Lett. 126 (2021), 176402.

[2] P.N.H. Nakashima, "The Crystallography of Aluminum and its Alloys", The Encyclopedia of Aluminum and its Alloys 1 (2019), 488-586.

[3] A. Genoni, L. Bučinský, N. Claiser, J. Contreras‐García, B. Dittrich, P.M. Dominiak, E. Espinosa, C. Gatti, P. Giannozzi, J.‐M. Gillet, D. Jayatilaka, P. Macchi, A.Ø. Madsen, L. Massa, C.F. Matta, K.M. Merz Jr, P.N.H. Nakashima, H. Ott, U. Ryde, K. Schwarz, M. Sierka & S. Grabowsky, "Quantum Crystallography: Current Developments and Future Perspectives", Chem. Eur. J. (2018), 10881-10905.

[4] Y. Zhu, P.N.H. Nakashima, A.M. Funston, L. Bourgeois & J. Etheridge, "Topologically Enclosed Aluminium Voids as Plasmonic Nanostructures", ACS Nano 11 (2017), 11383-11392.

[5] P.N.H. Nakashima, A.F. Moodie & J. Etheridge, "Direct Atomic Structure Determination by the Inspection of Structural Phase", Proc. Nat'l Acad. Soc. USA 110 (2013), 14144-14149.

[6] P.N.H. Nakashima, A.E. Smith, J. Etheridge & B.C. Muddle, "The Bonding Electron Density in Aluminium", Science 331 (2011), 1583-1586.

[7] P.N.H. Nakashima & B.C. Muddle, "Differential Convergent-Beam Electron Diffraction: Experiment and Theory", Phys. Rev. B 81 (2010), 115135.

[8] P.N.H. Nakashima & B.C. Muddle, "Differential Quantitative Analysis of Background Structure in Energy-Filtered Convergent-Beam Electron Diffraction Patterns", J. Appl. Cryst. 43 (2010), 280-284.

[9] P.N.H. Nakashima, "Thickness Difference: A New Filtering Tool for Quantitative Electron Diffraction", Phys. Rev. Lett. 99 (2007), 125506.

[10] P.N.H. Nakashima & A.W.S. Johnson, "Measuring the PSF from Aperture Images of Arbitrary Shape - An Algorithm", Ultramicroscopy 94 (2003), 135-148.